The 80th JSAP Autumn Meeting 2019

Presentation information

Symposium (Oral)

Symposium (technical) » New development of surface and interface evaluation methods for thin films

[19a-B31-1~5] New development of surface and interface evaluation methods for thin films

Thu. Sep 19, 2019 9:00 AM - 11:45 AM B31 (B31)

Yoshinobu Nakamura(Univ. of Tokyo), Tomoki Abe(Tottori Univ.)

9:15 AM - 10:00 AM

[19a-B31-2] Recent Interests in Functional Oxide Thin Films -Topics on Surface and Interface-

Hitoshi Tabata1 (1.Univ. of Tokyo)

Keywords:oxide electronics, surface, interface

機能性酸化物薄膜(表面、界面機能を中心に)における最近の興味深い研究について、磁気的(スピン、マグノン)、電気的(輸送特性、誘電性、トポロジカル機能)、光学的(磁気光学、プラズモン等)視点から紹介する。