2019年第80回応用物理学会秋季学術講演会

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一般セッション(口頭講演)

3 光・フォトニクス » 3.6 超高速・高強度レーザー

[19a-E205-1~12] 3.6 超高速・高強度レーザー

2019年9月19日(木) 09:00 〜 12:15 E205 (E205)

小栗 克弥(NTT)

09:00 〜 09:15

[19a-E205-1] Coherent extreme-ultraviolet emission generated through frustrated tunneling ionization, studied by strong field approximation

Je Hoi Mun1、Hyeok Yun1、Sung In Hwang1、Igor A. Ivanov1、Chang Hee Nam1,2、Kyung Taec Kim1,2 (1.IBS、2.GIST)

キーワード:Tunneling ionization, Frustrated tunneling ionization, EUV emission

In this presentation, strong field approximation model for the FTI and the subsequent EUV emission is provided. The validity of the model is supported from the comparison between results of the SFA model and the ones from the time-dependent Schrödinger equation. Our experimental results are also well explained by the SFA model.