The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

7 Beam Technology and Nanofabrication » 7.1 X-ray technologies

[19p-E318-1~10] 7.1 X-ray technologies

Thu. Sep 19, 2019 1:30 PM - 4:30 PM E318 (E318)

Mitsunori Toyoda(Tokyo Polytechnic Univ.), Toshihide Tsuru(Yamagata Univ.)

2:15 PM - 2:30 PM

[19p-E318-4] STED phenomenon in soft X-ray excited luminescence of Ce: LSO

Takeo Ejima1, Toshitaka Wakayama2, Natsumi Shinozaki3, Misaki Shoji3, Takayuki Ishiyama2, Kazuyuki Sakaue4, Takeshi Higashiguchi3 (1.IMRAM, Tohoku Univ., 2.Saitama Med. Univ., 3.Utsunomiya Univ., 4.UT-PSC)

Keywords:SX excited STED, scintillators, stimulated emission depletion

In this study, luminescence area was tried to be limitted using vector-polarized light in luminescence of Ce:LSO, which is unknown to exhibit the STED phenomenon. As a result, the luminescence of Ce:LSO excited by the soft X-ray of 800 eV photon energy was quenched by the STED light, and the luminescence area was limited centering on the dark point of the STED light.