[19p-PB7-1~16] 12.1 Fabrications and Structure Controls

[19p-PB7-2] In-situ Observation of Orientation Changes of α,ω–Di(decyl)quarterthiophene Thin Film by 2D-GIXD

〇Yuki Abe¹, Daiki Kuzuhara¹, Tomoyuki Koganezawa², Noriyuki Yoshimoto¹ (1.Iwate Univ., 2.JASRI)

Keywords:X-ray diffraction

The orientation of the organic thin film affects the characteristics of the organic device. It is known that, with linear molecules, the molecular axis is oriented parallel to the substrate as the substrate temperature is lower, and vertically oriented as the substrate temperature is higher. However, there is not much research on the mechanism by which the orientation changes. Then, for the purpose of elucidation of the mechanism, C10-4T was used for thin film preparation by vacuum evaporation and real-time observation of orientation change by two-dimensional oblique incidence X-ray diffraction method (2D-GIXD).