Structural Determination of the Epitaxial C<sub>60</sub> Overlayer on the 3,4,9,10-Perylenetetracarboxylicdianhydride Single Crystal by Grazing Incidence X-ray Diffraction

Kana Takahashi; Ryohei Tsuruta; Kohei Kasamatsu; Masaki Iwashita; Takuya Hosokai; Koganezawa Tomoyuki; Yasuo Nakayama

Presentation information

Oral presentation

12 Organic Molecules and Bioelectronics » 12.2 Characterization and Materials Physics

[20a-E308-1~10] 12.2 Characterization and Materials Physics

Fri. Sep 20, 2019 9:00 AM - 11:45 AM E308 (E308)

Hiroyuki Yoshida(Chiba Univ.), Tomoko Inose(Hokkaido Univ.)

9:15 AM - 9:30 AM

[20a-E308-2] Structural Determination of the Epitaxial C₆₀ Overlayer on the 3,4,9,10-Perylenetetracarboxylicdianhydride Single Crystal by Grazing Incidence X-ray Diffraction

〇(M1)Kana Takahashi¹, Ryohei Tsuruta¹, Kohei Kasamatsu¹, Masaki Iwashita¹, Takuya Hosokai², Koganezawa Tomoyuki³, Yasuo Nakayama¹ (1.Tokyo Univ. Sci., 2.AIST, 3.JASRI)

Keywords:organic semiconductor, grazing incidence X-ray diffraction

« Previous in this session
Next in this session »

▲

Presentation information

[20a-E308-1~10] 12.2 Characterization and Materials Physics

[20a-E308-2] Structural Determination of the Epitaxial C60 Overlayer on the 3,4,9,10-Perylenetetracarboxylicdianhydride Single Crystal by Grazing Incidence X-ray Diffraction

[20a-E308-2] Structural Determination of the Epitaxial C₆₀ Overlayer on the 3,4,9,10-Perylenetetracarboxylicdianhydride Single Crystal by Grazing Incidence X-ray Diffraction