[20a-E318-1~11] 【CS.7】 Code-sharing Session of 7.2 & 7.4 & 9.5

[20a-E318-7] Atomic phase retrieval technique by DPC STEM

〇Takehito Seki¹, Yuichi Ikuhara^1,2, Naoya Shibata^1,2 (1.Univ. Tokyo, 2.JFCC)

Keywords:Electron microscopy

DPC STEM is a high-resolution technique to visualize local electromagnetic fields inside a specimen. Using an atom-resolved electron probe, electric fields between nuclei and surrounding electrons can be measured. The measured electric field map should contain information about local chemical bonding. However, the probe electron is scattered multiple time during transmitting the specimen, it is not easy to interpret the data. In this study, we develop a new technique to retrieve atomic potential at high accuracy in the presence of the multiple scattering.