9:45 AM - 10:00 AM
[20a-N304-3] Structural analysis of InGaN/GaN multi quantum well nanowires by in situ synchrotron X-ray dffraction
Keywords:nitride semiconductor nanowire, in situ X-ray diffraction
Oral presentation
Code-sharing session » 【CS.3】 Code-sharing Session of 3.10 & 3.11 & 9.2 & 11.5 & 13.6
Fri. Sep 20, 2019 9:00 AM - 11:45 AM N304 (N304)
Kenji Tsujino(Tokyo women's medical Univ.)
9:45 AM - 10:00 AM
Keywords:nitride semiconductor nanowire, in situ X-ray diffraction