[20a-PB2-1~59] 12.5 Organic solar cells

[20a-PB2-44] Novel ion impurity amount measurement method in OPV materials

〇Noriaki Oyabu¹, Masaru Inoue², Yo Kumoda³, Yu Suenaga³, Hiroyoshi Naito^3,4 (1.TOYO Corp., 2.TOYOTech, 3.Osaka Pref. Univ., 4.RIMED)

Keywords:impurity ion, organic photovoltaics, organic semiconductor

In the TFT-LCD industry it is well known that ion inpurities in the LC causes display defects such as image sticking, display mura and flicker phenomena. The amount of ion inpurities can be obtained from ion peak area in the transient current for triangle voltage to a test cell. Recently we have developed a novel ion impurity amount measurement method based on the technique. In this study we measured the ion impurity amount of OPV materials in solvents, and investigated a correlation between ion impurity amount and OPV device characteristics.