[20p-E202-1~17] 12.1 Fabrications and Structure Controls

△ [20p-E202-1] Crystal Structure Analysis of α,ω-Di-decyl-quaterthiophene Thin Film by Two-Dimensional Grazing Incidence X-ray Diffractometry

〇Daiki Terui¹, Mamoru Kikuchi¹, Daiki Kuzuhara¹, Takeshi Watanabe², Tomoyuki Koganezawa², Ichiro Hirosawa², Noriyuki Yoshimoto¹ (1.Iwate Univ., 2.JASRI)

Keywords:X-ray Diffractometry

Investigation of the crystal structure of organic thin film layers in organic devices is important for improvement of the device performance, which strongly depends on molecular orientations and crystal structures. It has been considered that the crystal structure in thin films has the same structure in the bulk single crystal, but sometimes it might be different. Therefore, it is necessary to establish a method to solve an accurate crystal structure from polycrystalline organic thin films. In this study, the method for analyzing crystal structures of organic thin films by grazing incidence X-ray diffractometry (2D-GIXD) are applied to α,ω-Di-decyl-quaterthiophene (C10-4T) thin film and lattice parameters and the molecules alignments were determined.