2019年第80回応用物理学会秋季学術講演会

講演情報

一般セッション(口頭講演)

3 光・フォトニクス » 3.9 テラヘルツ全般

[20p-E206-1~11] 3.9 テラヘルツ全般

2019年9月20日(金) 13:45 〜 16:45 E206 (E206)

松原 英一(旭川高専)、鈴木 左文(東工大)

15:30 〜 15:45

[20p-E206-7] Effect of introducing phosphorous in the GaAs-based terahertz MEMS bolometers

Boqi Qiu1、Ya Zhang2、Kouichi Akahane3、Naomi Nagai1、Kazuhiko Hirakawa1 (1.IIS/INQIE UTokyo、2.TUAT、3.NICT)

キーワード:Terahertz bolometer, MEMS resonator

Terahertz (THz) detector is one of the crucial components in the THz technologies. Recently, we reported an uncooled, all electrical driving and detecting, very sensitive thermometer using a GaAs doubly clamped microelectromechanical (MEMS) beam resonator for bolometer applications. When the MEMS beam is heated by THz radiation, thermal expansion is induced in the MEMS beam and its resonance frequency decreases. The present device detects the frequency reduction induced by heating and works as a very sensitive thermometer. According to a simple theory, longer beams are expected to have higher thermal responsivities. However, we found that the measured responsivities of GaAs MEMS beam resonators deviates from theory due to initial deflection of the MEMS beams. In this work, we have introduced a preloaded tensile strain in the MEMS beams in order to reduce the initial deflection of the beam. We use a lattice mismatch between GaAs and GaAsP.