[20p-PA2-1~14] 12.2 Characterization and Materials Physics

[20p-PA2-3] Investigation of local carrier distributions in organic thin-film transistors
using Kelvin-probe force microscopy and scanning capacitance force microscopy

〇(M1)Akito Tominami¹, Hirohumi Yamada¹, Kei Kobayashi¹ (1.Kyoto Univ.)

Keywords:scanning probe microscopy