[21a-E303-1~12] 2.4 Accelerator Mass Spectrometry, Accelerator Beam Analysis

[21a-E303-11] Evaluation of SiAlON Scintillators utilizing Ion Micro-beam-induced Luminescence Analysis

〇Wataru Kada¹, Takahiro Sekine¹, Takahiro Satoh², Akihito Yokoyama^1,2, Suzuya Yamada³, Kenta Miura¹, Tomihiro Kamiya¹, Osamu Hanaizumi¹ (1.Gunma Univ., 2.TARRI, QST, 3.Denka Co., Ltd.)

Keywords:IBIL, SiAlON, Microscopic Spectroscopy

Scintillators are often used in various measurement of charged particles including beam profiling or quality estimation in charged-particle beam irradiation experiments. For such scintillators for charged particle detection, radiation hardness is taken as a key performance indicator as well as its detection efficiency. Recently we have characterized various scintillators utilizing ion beam induced luminescence (IBIL) analysis with a focused ion beam probe. In this study, we performed IBIL spectroscopy of SiAlON scintillators using a 3 MeV H⁺ microbeam as a probe and optical detectors with sensitivity range of 300-950 nm. Light emission yield and optical properties of three different types of SiAlON scintillators were evaluated in single particle level. Experimental results suggested that IBIL microscopic spectroscopy allows us a detailed characterization of scintillators of charged particle detection in small particle domain by utilizing scanning focused microprobe.