The 80th JSAP Autumn Meeting 2019

Presentation information

Oral presentation

2 Ionizing Radiation » 2.4 Accelerator Mass Spectrometry, Accelerator Beam Analysis

[21a-E303-1~12] 2.4 Accelerator Mass Spectrometry, Accelerator Beam Analysis

Sat. Sep 21, 2019 9:00 AM - 12:30 PM E303 (E303)

Masashi Ohno(Univ. of Tokyo), Masanori Kidera(Riken), Yasuto Miyake(Riken)

9:45 AM - 10:00 AM

[21a-E303-4] [Highlight] Trace Element Analysis using ECR Ion Source and Heavy Ion Linear Accelerator

Masanori Kidera1, Kazuya Takahashi1, Takahide Nakagawa1 (1.RIKEN)

Keywords:ECR ion source, Trace Element Analysis, Heavy Ion Linear Accelerator

Unlike accelerator mass spectrometry (AMS) performed in combination of a negative ion source + a tandem accelerator, a new accelerator mass spectrometry was developed that combines a positive ion source (ECR ion source), a heavy ion linear accelerator (RILAC) and an ionization chamber with multipolar electrodes as particle detection. We will announce some experimental results that have been carried out with this system. The introduction techniques of the solid samples and the feature of ionization in the ECR ion source will also be described in detail.