The 80th JSAP Autumn Meeting 2019

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Poster presentation

13 Semiconductors » 13.2 Exploratory Materials, Physical Properties, Devices

[21a-PA3-1~7] 13.2 Exploratory Materials, Physical Properties, Devices

Sat. Sep 21, 2019 9:30 AM - 11:30 AM PA3 (PA)

9:30 AM - 11:30 AM

[21a-PA3-7] Impurity difference of time resolution photothermal divergences signal on SiC surface

〇Shintaro Harada1, Takanori Kozai1, Takeshi Hujihara1, Tao Zheng1, Tomoya Konishi1, Masaru Kamano1 (1.NIT Anan College)

Keywords:SiC, impurity