09:30 〜 09:45
▲ [10a-M101-3] Magnetic and structural analysis of Pt/Co thin films deposited on Si/SiO2 substrates annealed by RTA
キーワード:CoPt, thin film
We fabricate Pt/Co thin films onto thermally-oxidized Si substrates with Ti layer deposited by electron-beam evaporation. These films are subsequently annealed by rapid thermal annealing (RTA) to make ferromagnetic Co-Pt alloys. The surface morphologies of the films are observed by a scanning electron microscope (SEM). Their crystalline structures and magnetic properties are also characterized by X-ray diffraction (XRD) at KEK (BL-8B) and a vibrating sample magnetometer (VSM), respectively. From the SEM images, clear change in surface morphology between the films before and after annealing at above 400 °C is observed. The M-H loops of the films before and after annealing at 400 °C indicate that the annealing makes Co-Pt alloys with larger saturation magnetization.