2019年第66回応用物理学会春季学術講演会

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一般セッション(口頭講演)

10 スピントロニクス・マグネティクス » 10.2 スピン基盤技術・萌芽的デバイス技術

[10a-M101-9~12] 10.2 スピン基盤技術・萌芽的デバイス技術

2019年3月10日(日) 11:30 〜 12:30 M101 (H101)

水口 将輝(東北大)

11:30 〜 11:45

[10a-M101-9] Lock-in thermoreflectance as a tool for investigating spin caloritronics

〇(D)Takumi Yamazaki1、Ryo Iguchi2、Hosei Nagano1、Ken-ichi Uchida2,3,4 (1.Nagoya Univ.、2.NIMS、3.The Univ. of Tokyo、4.CSRN Tohoku Univ.)

キーワード:thermoreflectance, spin caloritronics, spin Peltier effect

Thermal management of spintronics devices is necessary for further reducing power consumption. In spintronics devices, a variety of spin caloritronic phenomena can appear and contribute to modulate the temperature. In order to link spin caloritronics to thermal management technologies, it is necessary to measure the thermal response of spintronics devices in a wide frequency range and high spatial resolution. Although the lock-in thermography method is effectively used for spin-caloritronics studies because of its high-temperature resolution, it is difficult to measure the high-frequency thermal response in high spatial resolution. In this research, the lock-in thermoreflectance method is applied to investigating spin caloritronic phenomena. In order to confirm its validity, the spin Peltier effect (SPE) was measured by using the developed equipment. We revealed the high-frequency response of the SPE and demonstrated that the temperature resolution of the lock-in thermoreflectance reaches the level of several mK in a wide frequency range, confirming the usefulness of this method in spin-caloritronics studies.