2019年第66回応用物理学会春季学術講演会

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6 薄膜・表面 » 6.3 酸化物エレクトロニクス

[10a-W641-1~10] 6.3 酸化物エレクトロニクス

2019年3月10日(日) 09:00 〜 11:45 W641 (W641)

片山 司(東大)

11:15 〜 11:30

[10a-W641-9] Nanoscale dynamics of oxygen ions in SrFeO2.5+d epitaxial thin films

〇(P)Yooun Heo1、Daisuke Kan1、Yuichi Shimakawa1 (1.Kyoto Univ.)

キーワード:thin films, oxygen dynamics, conductive atomic force microscopy

A variety of functional properties in transition metal oxides are often underpinned by oxygen vacancies. While the oxygen vacancy concentration and arrangements are well-known to have strong influence on physical properties of oxides, the oxygen dynamics in oxides— including oxygen ion incorporation and movements during redox reactions—remain elusive.
To obtain insights to the oxygen dynamics, we focus on the oxygen nonstoichiometric iron-based oxide SrFeO2.5+d. While the brownmillerite(BM)-structured SrFeO2.5 is insulating, oxidizing it can lead to the perovskite(PV)-structured SrFeO2.5+d and increases its electrical conductivity. Importantly, the conducting property in SrFeO2.5+d strongly depends on the oxygen contents, which allows one to evaluate oxygen dynamics involving local redox reactions. In this study, we evaluate nanoscale oxygen dynamics in SrFeO2.5+d epitaxial thin films by investigating their structures and local conductions associated with redox reactions by X-ray diffraction (XRD) and conductive atomic force microscopy (c-AFM)