The 66th JSAP Spring Meeting, 2019

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6 Thin Films and Surfaces » 6.4 Thin films and New materials

[10p-W323-1~16] 6.4 Thin films and New materials

Sun. Mar 10, 2019 1:45 PM - 6:15 PM W323 (W323)

Hiroaki Nishikawa(Kindai Univ.), Akira Ohtomo(Tokyo Tech)

4:45 PM - 5:00 PM

▼ [10p-W323-11] Density functional study on intrinsic and impurity defect formation in layered SrTiN2

〇Xinyi He1, Zewen Xiao1, Takayoshi Katase1,2, Keisuke Ide1, Hideo Hosono1,3, Toshio Kamiya1,3 (1.MSL, Tokyo Tech, 2.PRESTO, JST, 3.MCES, Tokyo Tech)

Keywords:Layered nitride, Density functional theory, defect property