2019年第66回応用物理学会春季学術講演会

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一般セッション(口頭講演)

コードシェアセッション » 【CS.5】6.1 強誘電体薄膜、13.3 絶縁膜技術、13.5 デバイス/配線/集積化技術のコードシェアセッション

[10p-W631-1~12] CS.5 6.1 強誘電体薄膜、13.3 絶縁膜技術、13.5 デバイス/配線/集積化技術のコードシェアセッション

2019年3月10日(日) 13:45 〜 17:00 W631 (W631)

小林 正治(東大)、清水 荘雄(東工大)、藤井 章輔(東芝メモリ)

16:30 〜 16:45

[10p-W631-11] Polarization Switching as the Cause of Steep Subthreshold Slope in Ferroelectric FETs

〇(D)Chengji Jin1、Takuya Saraya1、Toshiro Hiramoto1、Masaharu Kobayashi1 (1.IIS, Univ. of Tokyo)

キーワード:Negative capacitance, steep SS, ferroelectric

For future energy-efficient computing, Ferroelectric FET (FeFET) with steep subthreshold slope (SS) has been proposed. Since the physical mechanism of steep SS is based on negative capacitance (NC) effect of ferroelectric (FE) material, it is also called negative capacitance FET (NCFET). NC effect is original proposed based on the quasi-static theory where the metastable NC region in S-shaped polarization-voltage (P-V) curve of FE can be stabilized by connecting an appropriate positive capacitor. In this work, we show NC effect and sub-60 SS can be explained by classical polarization switching dynamics in a transient aspect without tracing the S-shaped P-V curve. We call it transient NC (TNC).