5:15 PM - 5:30 PM
[11p-70A-17] Defect formation at metal/(SiC, GaN) interfaces in electric field; First-principles study
Keywords:interface, defect
Presentation information
Oral presentation
15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)
[11p-70A-1~17] 15.6 Group IV Compound Semiconductors (SiC)
Mon. Mar 11, 2019 1:00 PM - 5:30 PM 70A (70th Anniversary Auditorium)
Koichi Murata(CRIEPI), Tomoaki Furusho(Mitsubishi Electric)