Nano-level analysis of polarization domain distribution at surfaces of Bi<sub>4</sub>NbO<sub>8</sub>Br

Daichi Mizushima; Hirata Kaito; Zhong Chengchao; Miyata Kazuki; Miyazawa Keisuke; Kageyama Hiroshi; Fukuma Takeshi

Presentation information

Oral presentation

1 Interdisciplinary Physics and Related Areas of Science and Technology » 1.5 Instrumentation, measurement and Metrology

[11p-M116-1~15] 1.5 Instrumentation, measurement and Metrology

Mon. Mar 11, 2019 1:15 PM - 5:00 PM M116 (H116)

Nao Terasaki(AIST), Abe Hisashi (AIST), Minami Amano(AIST)

3:00 PM - 3:15 PM

[11p-M116-8] Nano-level analysis of polarization domain distribution at surfaces of Bi₄NbO₈Br

〇Daichi Mizushima¹, Hirata Kaito², Zhong Chengchao³, Miyata Kazuki^2,4, Miyazawa Keisuke⁴, Kageyama Hiroshi³, Fukuma Takeshi^2,4 (1.Dept. Of. Eng., Kanazawa Univ., 2.Grad. School of Kanazawa Univ., 3.Grad. School of Kyoto Univ., 4.NanoLSI, at Kanazawa Univ.)

Keywords:Atomic Force Microscope, photocatalyst, Piezoresponse Force Microscopy

Presentation information

[11p-M116-1~15] 1.5 Instrumentation, measurement and Metrology

[11p-M116-8] Nano-level analysis of polarization domain distribution at surfaces of Bi4NbO8Br

[11p-M116-8] Nano-level analysis of polarization domain distribution at surfaces of Bi₄NbO₈Br