The 66th JSAP Spring Meeting, 2019

Presentation information

Symposium (Oral)

Symposium » Advanced ion microscopy for future nano scale materials and devices

[11p-W934-1~8] Advanced ion microscopy for future nano scale materials and devices

Mon. Mar 11, 2019 1:30 PM - 5:45 PM W934 (W934)

Reo Kometani(Univ. of Tokyo), Hiroshi Mizuta(JAIST), Shinichi Ogawa(AIST)

4:45 PM - 5:15 PM

[11p-W934-7] Current Status of High Resolution In Situ and Environmental TEM Studies of Material Reactions

Robert Sinclair1, Yunzhi Liu1, Ai Leen Koh1 (1.Stanford Univ.)

Keywords:TEM