[12a-M103-1~11] 2.2 Detection systems

[12a-M103-4] Study of detector reponse CdTe SPECT imager for high-resolution gamma-ray 3D imaging

〇Goro Yabu¹, Tenyo Kawamura¹, Kento Furukawa¹, Tadashi Orita¹, Shin'ichiro Takeda¹, Shin Watanabe², Tadayuki Takahashi¹, Kazunobu Ohnuki³, Hirofumi Fujii³ (1.UTokyo, 2.ISAS/JAXA, 3.NCC)

Keywords:CdTe, semiconductor