The 66th JSAP Spring Meeting, 2019

Presentation information

Oral presentation

13 Semiconductors » 13.7 Compound and power electron devices and process technology

[12a-M121-1~9] 13.7 Compound and power electron devices and process technology

Tue. Mar 12, 2019 9:00 AM - 11:30 AM M121 (H121)

Keita Konishi(Tokyo Univ. of Agri. and Tech.)

9:45 AM - 10:00 AM

[12a-M121-4] Normally-Off β-Ga2O3 MOSFET with Nitrogen-Doped Channel

Takafumi Kamimura1, Yoshiaki Nakata1, Man Hoi Wong1, Hong Phuc Than1, Masataka Higashiwaki1 (1.NICT)

Keywords:Gallium oxide (Ga2O3), Power device

Since β-Ga2O3 has a large band gap of 4.5 eV and a high dielectric breakdown electric field of 5 MV/cm or more, it attracts attention as a future power device semiconductor material. So far, we have realized a vertical normally-on MOSFET in which a current blocking layer was formed by ion implantation doping of nitrogen (N) functioning as a deep acceptor in β-Ga2O3. Here we report the fabrication and its characteristics of a lateral normally-off β-Ga2O3 MOSFET using N-doped Ga2O3 channel.