2019年第66回応用物理学会春季学術講演会

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一般セッション(口頭講演)

7 ビーム応用 » 7.2 電子ビーム応用

[9a-S223-1~9] 7.2 電子ビーム応用

2019年3月9日(土) 09:30 〜 12:00 S223 (S223)

橘田 晃宜(産総研)、川久保 貴史(香川高専)

09:45 〜 10:00

[9a-S223-2] Electro-plating and stripping of lead dendrites observed by operando scanning electron microscopy with an electrochemical cell

Gada He1、Yoshifumi Oshima1、Masahiko Tomitori1 (1.JAIST)

キーワード:scanning electron microscope, electrochemical cell, electro-plating and stripping

We developed a conventional electrochemical cell for scanning electron microscopy (SEM) (in-lens FE-SEM (S-5200, Hitachi)) to observe the processes of electro-plating and stripping simultaneously with measuring the cyclic voltammetry using two electrode terminals. Lead dendrites on an Au electrode in a 1.5 M Pb(NO3)2 solution in the cell were grown and decomposed during a cyclic of voltammogram. The operando SEM observation revealed that initially Pb islands formed, followed by dendritic growth. The substrate shape dependence of the process will be discussed.