[9p-PA5-1~12] 6.6 Probe Microscopy

[9p-PA5-12] Bimodal AFM in Ionic Liquid using qPlus sensor

〇Yuya Yamada¹, Takashi Ichii¹, Toru Utsunomiya¹, Hiroyuki Sugimura¹ (1.Kyoto Univ.)

Keywords:atomic force microscopy, qPlus sensor, ionic liquid

Bimodal Atomic Force Microscopy is a method to detect the topography and the physical properties of surfaces at the same time by exciting the sensor at the primary and higher order resonance frequencies simultaneously. Analysis of physical properties at the interface between ionic liquid and solid is thought to have important knowledge for application of ionic liquids. In this work we worked on development of Bimodal AFM capable of detecting physical properties in ionic liquid using qPlus sensor.