[10a-Z14-1~13] 2.3 Application, radiation generators, new technology

[10a-Z14-3] Elemental analysis of deeply buried interface by using neutron total reflection

〇Mari Mizusawa^1,2, Kenji Sakurai², Dai Yamazaki]³, Kenichi Oikawa³, Masahide Harada³, Takayoshii Itp¹ (1.CROSS, 2.NIMS, 3.JAEA/J-PARC center)

Keywords:interface, neutron, elemental analysis

TTotal reflection neutron induced Gamma spectroscopy (TN-γ) is the method that detects gamma rays generated by the nuclear reaction between neutrons and a sampleat the deeply buried interface. Neutrons have high trancemittance, and enables sensitive analysis at deeply buried interface. Since gamma rays obtained in this process have higher energy than fluorescent X-rays, even light elements existing in deeply buried interfaces can be detected. In order to verify this method, We used a small reflectometer installed at BL10 at the J-PARC MLF. We tried to detect the gamma rays emitted from In-115 near the sample surface by irradiating the InP wafer with white neutrons under the total reflection condition. By optimizing the measurement conditions , we succeeded to detect 85, 90, 162, 186 and 416 keV gamma raysoriginating from In-155,. In the future, we will apply this method to the solid-liquid interface and apply it to the adsorption structure analysis of light element ions.