12:30 PM - 12:45 PM
[10p-Z06-1] Time-resolved measurements by Kelvin probe force microscopy with an intermittent bias application method
Keywords:Kelvin probe Force Microscopy, Time-resolved measurement, AFM
Oral presentation
6 Thin Films and Surfaces » 6.6 Probe Microscopy
Thu. Sep 10, 2020 12:30 PM - 5:30 PM Z06
Yoichi Otsuka(Osaka Univ.), Keisuke Miyazawa(Kanazawa Univ.)
12:30 PM - 12:45 PM
Keywords:Kelvin probe Force Microscopy, Time-resolved measurement, AFM