[11a-Z13-1~10] 12.1 Fabrications and Structure Controls

[11a-Z13-3] Discovery of Thin-Film Phase of DNTT by High-Resolution X-Ray Diffraction

〇Nobutaka Shioya¹, Takafumi Shimoaka¹, Takeshi Hasegawa¹ (1.ICR, Kyoto Univ.)

Keywords:organic semiconductor, XRD, vapor deposition

Dinaphthothienothiophene (DNTT) has received considerable interest as a promising material for organic thin-film transistors, replacing the conventional basic material of pentacene. Although the excellent device performances of DNTT are demonstrated by many reports, a comprehensive understanding of the thin film growth is much behind. In the present study, the thickness-dependent structural evolution is studied by using high-resolution X-ray diffraction. This technique reveals for the first time the existence of the “thin-film” phase, which has long been missed by the conventional analytical limit.