[11a-Z24-1~7] 3.9 Terahertz technologies

▲ [11a-Z24-2] Film thickness dependence on propagation loss of coated metal in terahertz waveguides

〇Yuyuan Huang¹, Kuniaki Konishi², Momoko Deura¹, Yusuke Shimoyama¹, Junji Yumoto², Makoto Kuwata-Gonokami², Yukihiro Shimogaki¹, Takeshi Momose¹ (1.Univ. of Tokyo. Sch. of Eng., 2.Univ. of Tokyo. Sch. of Sci.)

Keywords:Terahertz waveguides, Film thickess dependence, Propagation loss

Coated material in metal-coated dielectric terahertz parallel-plate waveguides are concentrated for studying relationship between film thickness and propagation loss. Copper film thickness dependence on propagation loss has been quantitatively investigated experimentally and theoretically. Model for calculating propagation loss incorporated by the measured resistivity and Drude model has been developed, shows good matching with experimental results. It is possible to precisely predict attenuation coefficient with assigned coated film thickness within this model.