[11a-Z25-1~10] 12.2 Characterization and Materials Physics

△ [11a-Z25-10] Kelvin Probe Study on Interface Properties of Solution-Processed Alkyl-Substituted Phthalocyanine Thin Film Ⅲ

〇Takuma Shono¹, Ryo Ishiura¹, Akihiko Fujii¹, Makoto Arita², Koichi Sudoh³, Masanori Ozaki¹ (1.Osaka Univ., 2.Kyushu Univ., 3.ISIR Osaka Univ.)

Keywords:organic semiconductor, surface potential, Kelvin probe force microscopy

It is important to clarify the interfacial physical properties between the organic semiconductor thin film prepared by the solution process and the electrode material for electronic device applications. In this study, we have evaluated the physical properties of the substrate interface by preparing a thin film of alkyl phthalocyanine single crystal coated on the highly stable n-Si and HOPG substrates and using Kelvin probe microscopy. The surface potential difference changed depending on the film thickness, and showed similar film thickness dependences on n-Si and HOPG substrates with equivalent work function. It was suggested that the work function difference between the organic semiconductor and the electrode was an important factor.