1:45 PM - 2:00 PM
[8p-Z01-2] Interface dipole layer observation in graphene field effect transistors by synchrotron soft X-ray operando spectromicroscopy
Keywords:graphene, X-ray photoemission spectroscopy, imaging
The linear band dispersion of graphene’s bands near the Fermi level gives rise to its unique electronic properties, such as a giant carrier mobility, and this has triggered extensive research in applications. Graphene is a so-called 2D material, so there is a strong dependence of the electronic properties of graphene on the surrounding interfaces. Here we study a graphene channel/SiO2 interface and a graphene channel/metal electrode interface. Then we achieve a detailed determination of the course of band alignment at the interfaces by means of soft X-ray operando scanning photoelectron spectromicroscopy.