[8p-Z01-1~7] Extreme environmental nano-interface science connecting materials and devices

[8p-Z01-2] Interface dipole layer observation in graphene field effect transistors by synchrotron soft X-ray operando spectromicroscopy

〇Naoka Nagamura^1,2, Hirokazu Fukidome³, Kosuke Nagashio⁴, Masaharu Oshima⁴ (1.NIMS, 2.JST PRESTO, 3.Tohoku Univ., 4.The Univ. of Tokyo)

Keywords:graphene, X-ray photoemission spectroscopy, imaging

The linear band dispersion of graphene’s bands near the Fermi level gives rise to its unique electronic properties, such as a giant carrier mobility, and this has triggered extensive research in applications. Graphene is a so-called 2D material, so there is a strong dependence of the electronic properties of graphene on the surrounding interfaces. Here we study a graphene channel/SiO₂ interface and a graphene channel/metal electrode interface. Then we achieve a detailed determination of the course of band alignment at the interfaces by means of soft X-ray operando scanning photoelectron spectromicroscopy.