[8p-Z03-1~6] What comes after " Materials Informatics"

[8p-Z03-3] Materials informatics in quantum beam characterizations

〇Kanta Ono¹ (1.KEK)

Keywords:quantum beam, materials informatics, materials characterization

Measurements using quantum beams such as X-rays and neutrons are indispensable for the characterization of materials. The recent development of high-throughput measurement has made the speed of the measurement dramatically improved. The essence of materials characterizarion is to extract useful information for materials research, and it is not achieved by only performing high-throughput measurements. In this talk, we will present recent research to maximize the information obtained per time and cost in materials measurements.