The 81st JSAP Autumn Meeting, 2020

Presentation information

Oral presentation

3 Optics and Photonics » 3.8 Optical measurement, instrumentation, and sensor

[8p-Z19-1~24] 3.8 Optical measurement, instrumentation, and sensor

Tue. Sep 8, 2020 1:00 PM - 8:00 PM Z19

Tatsutoshi Shioda(Saitama Univ.), Toshihiro Somekawa(Inst. for Laser Tech.), Minoru Tanabe(AIST), Takeo Minamikawa(Tokushima Univ.)

1:30 PM - 1:45 PM

[8p-Z19-2] Simultaneous determination of Jones and Mueller matrices for polarimetric characterization of a homogeneous medium

〇(D)Vipin Tiwari1, Nandan Bisht1 (1.Applied Optics & Spectroscopy laboratory, Department of Physics, KU, SSJ campus Almora (263601), Uttarakhand, India.)

Keywords:Jones matrix imaging, Mueller matrix imaging, Spatial light modulator

Polarimetry is a versatile tool to study the microstructural optical properties of a medium. Jones matrix imaging and Mueller matrix imaging are most commonly used techniques for the polarimetric characterization of a medium. Meanwhile, Jones matrix imaging is preferred when the medium is homogeneous in nature whereas Mueller matrix imaging is useful for anisotropic medium. In practice, none of the medium has perfectly homogeneous structure. Therefore, both these techniques are necessary to be implemented for complete polarimetric characterization of a sample. The determination of Jones matrix and Mueller matrix of a medium in a single frame is still a challenging task. In this paper, we demonstrate an analytic inversion method to transform the Jones matrix of a homogenous medium i.e. spatial light modulator (SLM) into corresponding Mueller matrix.