2020年第81回応用物理学会秋季学術講演会

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一般セッション(口頭講演)

3 光・フォトニクス » 3.8 光計測技術・機器

[8p-Z19-1~24] 3.8 光計測技術・機器

2020年9月8日(火) 13:00 〜 20:00 Z19

塩田 達俊(埼玉大)、染川 智弘(レーザー総研)、田辺 稔(産総研)、南川 丈夫(徳島大)

13:30 〜 13:45

[8p-Z19-2] Simultaneous determination of Jones and Mueller matrices for polarimetric characterization of a homogeneous medium

〇(D)Vipin Tiwari1、Nandan Bisht1 (1.Applied Optics & Spectroscopy laboratory, Department of Physics, KU, SSJ campus Almora (263601), Uttarakhand, India.)

キーワード:Jones matrix imaging, Mueller matrix imaging, Spatial light modulator

Polarimetry is a versatile tool to study the microstructural optical properties of a medium. Jones matrix imaging and Mueller matrix imaging are most commonly used techniques for the polarimetric characterization of a medium. Meanwhile, Jones matrix imaging is preferred when the medium is homogeneous in nature whereas Mueller matrix imaging is useful for anisotropic medium. In practice, none of the medium has perfectly homogeneous structure. Therefore, both these techniques are necessary to be implemented for complete polarimetric characterization of a sample. The determination of Jones matrix and Mueller matrix of a medium in a single frame is still a challenging task. In this paper, we demonstrate an analytic inversion method to transform the Jones matrix of a homogenous medium i.e. spatial light modulator (SLM) into corresponding Mueller matrix.