[8p-Z25-1~13] 【CS.1】 Code-sharing Session of 2.4 & 7.5

[8p-Z25-8] Study on Size Distributions of Vacuum Electrospray Droplet Ions

〇Satoshi Ninomiya¹, Mikihiro Kawase¹, Lee Chuin Chen¹, Kenzo Hiraoka¹ (1.Univ. of Yamanashi)

Keywords:cluster ion, electrospray, secondary ion mass spectrometry

We have studied droplet ions produced by electrospray of aqueous solutions as a massive cluster beam for secondary ion mass spectrometry (SIMS) to much improve the ionization efficiencies. In the previous studies, the prototype of a vacuum electrospray droplet ion (V-EDI) gun was installed in a time-of-flight secondary ion mass spectrometer, and the secondary ion yields produced by the V-EDI beams were measured for several organic compounds. In this study, the size distributions of the V-EDI beams and sputtered volumes produced by the beams will be evaluated by the impact marks measured by a scanning probe microscope.