The 81st JSAP Autumn Meeting, 2020

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16 Amorphous and Microcrystalline Materials » 16.1 Fundamental properties, evaluation, process and devices in disordered materials

[8p-Z26-1~23] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

Tue. Sep 8, 2020 1:00 PM - 7:30 PM Z26

Tsuyoshi Honma(Nagaoka Univ. of Tech.), Akira Saitoh(Ehime Univ.), Tamihiro Gotoh(Gunma Univ.), Norimitsu Yoshida(Gifu Univ.)

6:45 PM - 7:00 PM

[8p-Z26-21] X-ray-penetration-depth dependence on the induced optical absorption bands in silica glas

〇Kento Nanbo1, Kazuma Tani1, Akihiro Haruki1, Nobu Kuzuu1, Hideharu Horikoshi2 (1.Univ. of Fukui, 2.Tosoh SGM)

Keywords:Silica glass, X-ray

The defect structure generated by X-ray irradiation is elucidated by investigating the induced light absorption band generated when the silica glass is irradiated with X-rays. In this research, X-rays are irradiated by stacking thin pieces of quartz glass. Then, by measuring the absorption spectrum of each sample piece, the distance dependence from the surface of the X-ray induced light absorption band characteristic was investigated.