Automated Cluster Analysis of 2-dimensional X-ray Diffraction for Composition Spread Oxide Thin Film Fabricated by Combinatorial Synthesis, Aiming to Visual Information-guided Material Discovery

Presentation information

Oral presentation

23 Joint Session N "Informatics" » 23.1 Joint Session N "Informatics"

Wed. Sep 9, 2020 1:00 PM - 6:00 PM Z09

Kiyou Shibata(the University of Tokyo), Masato Kotsugi(Tokyo Univ. of Sci.), Shigetaka Tomiya(SONY Corp.)

3:00 PM - 3:15 PM

〇(DC)Akihiro Yamashita^1,2, Takahiro Nagata², Shinjiro Yagyu², Toru Asahi¹, Toyohiro Chikyow² (1.Waseda Univ., 2.NIMS)

Keywords:Measurement Informatics, 2D-XRD