4:30 PM - 4:45 PM
▲ [9p-Z16-10] Quantification of induced local stress birefringence due to elastic inhomogeneity with surface plasmon microscopy towards label free detection of dermatoheliosis
Keywords:focused surface plasmon (FSP), stress birefringence, eccentricity
We study the relationship of induced local stress birefringence with the spatial frequency response of focused surface plasmon of thin film samples as a result of inhomogeneous elasticity. The change in eccentricity of the absorption pattern at the back focal plane of the microscope is a label free quantifier of local induced stress birefringence in the sample.