The 81st JSAP Autumn Meeting, 2020

Presentation information

Oral presentation

4 JSAP-OSA Joint Symposia 2020 » 4.1 Plasmonics and Nanophotonics

[9p-Z16-1~14] 4.1 Plasmonics and Nanophotonics

Wed. Sep 9, 2020 1:00 PM - 5:45 PM Z16

Nicholas Smith(Osaka Univ.), Takuo Tanaka(RIKEN)

4:30 PM - 4:45 PM

[9p-Z16-10] Quantification of induced local stress birefringence due to elastic inhomogeneity with surface plasmon microscopy towards label free detection of dermatoheliosis

〇(D)Ipsita Chakraborty1, Hiroshi Kano1 (1.Muroran Inst of Tech)

Keywords:focused surface plasmon (FSP), stress birefringence, eccentricity

We study the relationship of induced local stress birefringence with the spatial frequency response of focused surface plasmon of thin film samples as a result of inhomogeneous elasticity. The change in eccentricity of the absorption pattern at the back focal plane of the microscope is a label free quantifier of local induced stress birefringence in the sample.