16:30 〜 16:45
▲ [9p-Z16-10] Quantification of induced local stress birefringence due to elastic inhomogeneity with surface plasmon microscopy towards label free detection of dermatoheliosis
キーワード：focused surface plasmon (FSP), stress birefringence, eccentricity
We study the relationship of induced local stress birefringence with the spatial frequency response of focused surface plasmon of thin film samples as a result of inhomogeneous elasticity. The change in eccentricity of the absorption pattern at the back focal plane of the microscope is a label free quantifier of local induced stress birefringence in the sample.