Kohei Yamasue

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Speaker, Author, Co-Author

Fri. Mar 13, 2020 9:30 AM - 11:30 AM PA6 (PA)

Poster presentation
| 15 Crystal Engineering
| 15.6 Group IV Compound Semiconductors (SiC)

[13a-PA6-1~11] 15.6 Group IV Compound Semiconductors (SiC)

9:30 AM - 11:30 AM

[13a-PA6-5] Numerical study on relationship between spatial scale of interface defect distribution and field-effect mobility of SiC MOSFET

〇Kohei Yamasue¹, Yasuo Cho¹ (1.Tohoku Univ.)