9:30 AM - 11:30 AM [15a-PB4-13] TOF-SIMS analysis of the discolored electrodes of crystalline silicon PV mini-module degraded by pressure cooker test 〇Yuji Ino1, Shuichi Asao1, Katsuhiko Shirasawa1, Hidetaka Takato1 (1.AIST)