[14a-A205-1~10] 23.1 Joint Session N "Informatics"

Sat. Mar 14, 2020 9:30 AM - 12:15 PM A205 (6-205)

Hideki Yoshikawa(NIMS), Takuto Kojima(Nagoya Univ.)

△：Presentation by Applicant for JSAP Young Scientists Presentation Award
▲：English Presentation
▼：Both of Above
No Mark：None of Above

+Add all to schedule

9:30 AM - 9:45 AM

[14a-A205-1] Prediction and image mapping of electrical characteristics of crystal defects from photoluminescence profile using machine learning

〇(M1)Kazuki Mitamura¹, Kentaro Kutsukake², Takuto Kojima³, Noritaka Usami¹ (1.Eng., Nagoya Univ., 2.AIP, RIKEN, 3.Inf., Nagoya Univ.)

9:45 AM - 10:00 AM

[14a-A205-2] Features of Generation Points of Dislocation Clusters in Multicrystalline Silicon Ingot based on Transfer Learning of Convolutional Neural Network

〇Hiroaki Kudo¹, Tetsuya Matsumoto¹, Kentaro Kutsukake², Noritaka Usami³ (1.Grad. Sch. of Inf., Nagoya Univ., 2.Center for AIP, RIKEN, 3.Grad. Sch. of Eng., Nagoya Univ.)

10:00 AM - 10:15 AM

[14a-A205-3] Σ3ⁿ network analysis on multicrystalline silicon for photovoltaics

〇Takuto Kojima¹, Kazuya Tajima², Tetsuya Matsumoto¹, Hiroaki Kudo¹, Noritaka Usami² (1.Grad. Info. Nagoya Univ., 2.Grad. Eng. Nagoya Univ.)

10:15 AM - 10:30 AM

[14a-A205-4] Quantification of Microscopic Images of Materials based on Topological Data Analysis

〇Kazuto Akagi^1,2 (1.Tohoku Univ, 2.NIMS)

10:30 AM - 10:45 AM

[14a-A205-5] Calibration for Color-Sensitive Optical Sensor by Neural Network and its Application to Agriculture

〇Shinya Ueno^1,2, Osamu Sakai² (1.Checkers Co., Ltd., 2.Univ. Shiga Pref.)

11:00 AM - 11:15 AM

[14a-A205-6] Estimation of Properties of Gases Based on Transfer Function Ratios

〇Gaku Imamura¹, Genki Yoshikawa^1,2 (1.NIMS, 2.Univ. of Tsukuba)

11:15 AM - 11:30 AM

[14a-A205-7] Prediction of properties from carbon-K edge ELNES/XANES via neural network

〇Kakeru Kikumasa¹, Shin Kiyohara^2,3, Kiyou Shibata^1,3, Teruyasu Mizoguchi^1,3 (1.Grad. Sch. of Eng., the Univ. of Tokyo, 2.IIR, Tokyo Tech., 3.IIS, the Univ. of Tokyo)

11:30 AM - 11:45 AM

[14a-A205-8] Automatic sparse modeling of XPS spectrum using information criteria

〇Hiroshi Shinotsuka¹, Hideki Yoshikawa¹, Ryo Murakami², Kazuki Murakami², Hiromi Tanaka², Kazuhiro Yoshihara¹ (1.NIMS, 2.NIT, Yonago college)

11:45 AM - 12:00 PM

△ [14a-A205-9] Development of multi-element XPS spectral analysis using basis function of multiple-peaks

〇(B)Ryo Murakami¹, Kazuki Nakamura¹, Hiromi Tanaka¹, Hiroshi Shinotsuka², Kenji Nagata², Hideki Yoshikawa² (1.KOSEN, Yonago, 2.NIMS)

12:00 PM - 12:15 PM

[14a-A205-10] Bayesian statistics-based analysis of AC impedance spectra of a simple electrochemical device

〇(PC)Ryo Nakayama¹, Yu Miyazaki², Yasuo Nobuaki³, Yuki Watanabe¹, Ryota Shimizu^1,4, Kazunori Nishio¹, Yasunobu Ando⁵, Masakazu Sekijima^3,6, Taro Hitosugi¹ (1.Sch. Mater. Chem. Tech., Tokyo Tech, 2.Dep. Appl. Phys., Tokyo Univ., 3.Sch. Comput., Tokyo Tech, 4.JST-PRESTO, 5.AIST, 6.IIR, Tokyo Tech)

Session information