[12a-A405-1~11] 12.2 Characterization and Materials Physics

△ [12a-A405-5] Kelvin Probe Study on Interface Properties of Solution-Processed Alkyl-Substituted Phthalocyanine Thin Film II

〇Ryo Ishiura¹, Takuma Shono¹, Akihiko Fujii¹, Makoto Arita², Koichi Sudoh³, Masanori Ozaki¹ (1.Osaka Univ., 2.Kyushu Univ., 3.ISIR Osaka Univ.)

Keywords:organic semicoductor, Phthalocyanine, Kelvin probe microscopy

It is important to clarify the interface properties of organic semiconductor thin films for electronic device application. In this research, we prepared alkyl phthalocyanine single crystalline thin films coated on n-Si and HOPG substrates, and succeeded in elucidating the interface properties of organic semiconductor thin film prepared by solution process by using Kelvin probe microscopy. The surface potential difference changed depending on the film thickness, and showed similar film thickness dependences on n-Si and HOPG substrates with equivalent work function. It was suggested that the work function difference between the organic semiconductor and the electrode was an important factor.