2020年第67回応用物理学会春季学術講演会

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一般セッション(口頭講演)

15 結晶工学 » 15.3 III-V族エピタキシャル結晶・エピタキシーの基礎

[12a-D215-1~8] 15.3 III-V族エピタキシャル結晶・エピタキシーの基礎

2020年3月12日(木) 09:30 〜 11:45 D215 (11-215)

竹内 哲也(名城大)、高橋 正光(量研機構)

09:30 〜 09:45

[12a-D215-1] Photoluminescence Intensity Change of InGaAsN Quantum Well by Laser Irradiation

〇(D)Md Zamil Sultan1,2、Shuhei Yagi1、Kengo Takamiya1、Hiroyuki Yaguchi1 (1.Saitama Univ.、2.Haj. Dan. Sci. & Tech. Univ.(HSTU))

キーワード:Photoluminescence degradation, Quantum Well, Defects, Laser irradiation

Detailed micro PL measurements were carried out to investigate the change in the PL intensity from InGaAsN quantum well (QW) structure by laser irradiation at room temperature. The PL degradation is relatively constant for all laser power densities. Stronger laser irradiation was found to lead to faster decrease in the PL intensity. The way proposed in this study would be very useful to evaluate potential defect generation which causes the deterioration of optoelectronic device during the operation.