The 67th JSAP Spring Meeting 2020

Presentation information

Oral presentation

17 Nanocarbon Technology » 17.3 Layered materials

[12p-A401-1~6] 17.3 Layered materials

Thu. Mar 12, 2020 4:15 PM - 5:45 PM A401 (6-401)

Shintaro Sato(Fujitsu Lab.)

5:30 PM - 5:45 PM

[12p-A401-6] Carrier distribution in bilayer MoS2 under an external field

Mina Maruyama1, Kosuke Nagashio2, Susumu Okada1 (1.Univ. of Tsukuba, 2.Univ. of Tokyo)

Keywords:transition metal chalcogenide, electronic structure, FET

The electronic structure of bilayer MoS2 under an external electric field is studied in terms of the interlayer stacking arrangements using the density functional theory combined with the effective screening medium method. The calculations showed that the accumulated carrier distribution strongly depended on the interlayer stacking arrangement, field strength, and carrier concentration. The carriers were highly concentrated on the topmost layer of twisted bilayer MoS2, while carriers were also found in the second layer of bilayer MoS2 with the AB interlayer arrangements. In addition to the interlayer arrangements, the field and carrier concentration also affect the carrier distribution in the bilayer MoS2.