The 67th JSAP Spring Meeting 2020

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Oral presentation

6 Thin Films and Surfaces » 6.3 Oxide electronics

[12p-D411-1~14] 6.3 Oxide electronics

Thu. Mar 12, 2020 1:45 PM - 5:30 PM D411 (11-411)

Shoso Shingubara(Kansai Univ.), Shinya Aikawa(Kougakuin Univ.)

4:45 PM - 5:00 PM

[12p-D411-12] Improvement of Retention Characteristics in Ionic-Liquid-Supplied Conducting Bridge Memory

〇hiroshi sato1,2, kentaro kinoshita1, yusei honma2, hisashi shima2, yasuhisa naitoh2, hiroyuki akinaga2, toshiyuki itoh3 (1.Tokyo Univ. of Sci., 2.AIST, 3.Tottori Univ.)

Keywords:ReRAM, CARAM, Retention