The 67th JSAP Spring Meeting 2020

Presentation information

Poster presentation

7 Beam Technology and Nanofabrication » 7 Beam Technology and Nanofabrication(Poster)

[12p-PA2-1~4] 7 Beam Technology and Nanofabrication

Thu. Mar 12, 2020 1:30 PM - 3:30 PM PA2 (PA)

1:30 PM - 3:30 PM

[12p-PA2-1] Reaction induced electron beam of resist material based on Cu complex

Ayako Nakajima1, Takahiro Kozawa1 (1.Osaka Univ. ISIR)

Keywords:EB lithography, resist, complex

An alternative resist material was developed to break through the RLS trade-off. We focused complexes which contain metal atoms uniformly due to improve sensitivity. This presentation shows the qualities of synthesized Cu complexes as a resist material.