Optical characterization of single photon sources at SiO<sub>2</sub>/SiC inetrfaces

Presentation information

Poster presentation

15 Crystal Engineering » 15.6 Group IV Compound Semiconductors (SiC)

Fri. Mar 13, 2020 9:30 AM - 11:30 AM PA6 (PA)

9:30 AM - 11:30 AM

〇Mitsuaki Kaneko¹, Hideaki Takashima¹, Hiroki Kawaguchi¹, Shigeki Takeuchi¹, Tsunenobu Kimoto¹ (1.Kyoto Univ.)

Keywords:SiC, single photon source, polarization